BOOK REVIEW

 
John H. Hubbell
 
National Institute of Standards and Technology
Gaithersburg,    Maryland,   USA

    Handbook on Radiation Probing, Gauging, Imaging
    and Analysis

    Volume I: Basics and Techniques
    Volume II: Applications and Design

    Esam M.A. Hussein

    Dept. of Mechanical Engineering,
    University of New Brunswick,
    Fredericton, Canada

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    Kluwer Academic Publishers, Dordrecht, 2003
    Hardbound :
    Set (Vol. I & II) 990 pp.:    ISBN 1 4020 1296 9   US$354.00,  EUR300.00,  GBP 215.00.
    Vol. I : 464 pp.:   ISBN 1 4020 1294 2   US$177.00,   EUR190.00,   GBP129.00. 
    Vol. II : 526 pp.:   ISBN 1 4020 1295 0   US$177.00,   EUR190.00,   GBP 129.00.  

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    In browsing through this two-volume "how-to" desk reference on virtually all aspects of the use of photon and corpuscular radiations in the interrogation of materials and structures, I found the presentation format to be unique and useful. Although the variety and comprehensiveness is akin to a topical encyclopedia, the presentation reminded me of a thesaurus, in which the subtopics are not sequenced alphabetically, but, similar to a thesaurus, are sequenced in a logical progression. Then, going "Roget" one better, at the end of the book are found not one, but two alphabetized indexes, first an "application index" and finally a conventional index alphabetically listing key words and their page numbers from throughout the text.

    In Volume One (Basics and Techniques), following a brief Chapter 1 (Introduction) surveying the unique features of radiation interrogation, often the only available tool for some NDE (nondestructive evaluation) challenges, Part I (Basics) begins this logical progression, in Chapter 2 (Radiation Types and Sources), with the definitions and nature of the various available radiations and how they can be obtained, then progressing in Chapter 3 (Modifying Physics) to the basic underlying physical processes by which these different radiations interact with atoms and with bulk materials. Part I concludes with a virtual Baedeker to the many types of radiation detectors and their underlying principles in Chapter 4 (Detection Methods) and a briefer Chapter 5 (Radiation Safety) addressing both common-sense and mandatory regulatory concerns.

    In Part II (Techniques) the logical topical progression continues in Chapter 6 (Transmission Methods) with a comprehensive array of topics ranging from time-honored film radiography to the mathematical intricacies of tomography to the esoteric application of Mössbauer spectrometry. Chapters 7 (Scattering Methods), 8 (Emission Methods) and 9 (Absorption Methods) similarly provide encyclopedic coverage of the available methods and techniques in each of these categories. Volume One closes with several appendices (repeated in Volume Two) providing valuable information including (A) Basic Units and Constants, (B) List (alphabetically) of Elements and Natural Isotopes, (C) Relativistic Mechanics, (D) Quantum Mechanics, including the Schrödinger equation and the concept of cross-section, (E) Nuclear/Atomic Parameters for Compounds and Mixtures, (F) Effective Energy, and finally (G) Radiation Counting Statistics, including Poisson statistics, mean and variance. Following the appendices (in both Volumes) is the listing of the 1373 references including full titles and inclusive page numbers, followed in turn by the two indexes mentioned, an Application Index and a conventional Index concluding this monumental and uniquely useful "encyclopedic/thesauric" guide and companion through the thickets of radiation nondestructive probing, gauging, imaging and analysis.

    Volume Two (Applications and Design) brings the above wealth of "why?" and "how-to" information "into the real world" beginning in Part III (Applications) with an introductory Chapter 10 (Probing, Inspection and Monitoring) with topics ranging from the function of the alpha-particle sources in most smoke detectors (such as the ones in my home) to monitoring package-filling in opaque containers. This is followed by Chapter 11 (Gauging) listing and exhaustively discussing the otherwise-difficult-or-impossible interrogations of bulk density, thickness, porosity and voidage, moisture content, fluid flow and finally dating including with carbon-14 (geological time scales), tritium (short term, such as for ground waters) and the use of thermoluminescence for TL dating (archeological time scales). Chapter 12 (Elemental and Content Analysis) continues the logical progression of subtopics including nucleus-based analysis (e.g., activation analysis), atom-based analysis (e.g., x-ray fluorescence spectroscopy, XRFS), hydrogen measurement (mostly by neutrons), and material content analysis (e.g., applications of the above-mentioned Mössbauer spectroscopy). Concluding Part III, Chapter 13 (Imaging) catalogs and provides detailed information on the many different kinds of photon radiography, on neutron and charged-particle radiography, on tomography and on imaging for material content such as in dual-energy imaging.

    Finally, in Part IV (Design) the author shares the experiences and knowledge accumulated in his long and distinguished teaching and research career, much of it involved in synthesizing the above material into the invention, production and putting into practice a significant fraction of the above principles and devices for carrying out NDE tasks. Thus, Chapter 14 (Performance Parameters and Design Aspects) opens Part IV with material on performance parameters, statistical optimization, design objectives, and source, technique, and detection system selections, followed by Chapter 15 (Source Modulation), with collimation considerations, filtration, and for neutrons, both moderation and multiplication.

    The book's logical topical progression continues in Chapter 16 (Design Calculations) with subtopics on Monte Carlo simulations, and shielding requirements in the differing cases of x-ray machines, isotopic gamma sources, and for neutron sources. Finally, Chapter 17 (Experiments) treats the important considerations of licensing, background reduction and dynamic analysis to verify that the device will indeed perform its intended function, and the brief Chapter 18 (Finalization) discusses prototyping and intellectual property protection (trade secrets, copyright, trademarks and patents).

    Although this Handbook is intended for purchase as an integral two-volume set, it is anticipated that Volume I: Basics and Techniques will be purchased separately by some students for use as a textbook. On the other hand it is anticipated that some experienced practitioners will find Volume II: Applications and Design attractive for separate purchase, hence the three different purchase options as offered above, and the inclusion of the extensive and useful appendices in both volumes.

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